Reliability enhancement using in-field monitoring and recovery for RF circuits - researchr publication authors

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Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Günhan Dündar. Reliability enhancement using in-field monitoring and recovery for RF circuits. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]

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