Doohwang Chang, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Engin Afacan, Günhan Dündar. Reliability enhancement using in-field monitoring and recovery for RF circuits. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.