Geometric design for ultra-long needle probe card for digital light processing wafer testing

Hao-Yuan Chang, Wen-Fung Pan, Meng-Kai Shih, Yi-Shao Lai. Geometric design for ultra-long needle probe card for digital light processing wafer testing. Microelectronics Reliability, 50(4):556-563, 2010. [doi]

Abstract

Abstract is missing.