Chia-Ling Chang, Charles H.-P. Wen, Jayanta Bhadra. Process-variation-aware Iddq diagnosis for nano-scale CMOS designs - the first step. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 454-457, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
Abstract is missing.