An-Sheng Chao, Soon-Jyh Chang, Hsin-Wen Ting. A SAR ADC BIST for simplified linearity test. In IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011. pages 146-149, IEEE, 2011. [doi]
@inproceedings{ChaoCT11,
title = {A SAR ADC BIST for simplified linearity test},
author = {An-Sheng Chao and Soon-Jyh Chang and Hsin-Wen Ting},
year = {2011},
doi = {10.1109/SOCC.2011.6085122},
url = {http://dx.doi.org/10.1109/SOCC.2011.6085122},
researchr = {https://researchr.org/publication/ChaoCT11},
cites = {0},
citedby = {0},
pages = {146-149},
booktitle = {IEEE 24th International SoC Conference, SOCC 2011, Taipei, Taiwan, September 26-28, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1616-4},
}