Zhiteng Chao, Bin Sun, Hongqin Lyu, Ge Yu, Minjun Wang, Wenxing Li, Zizhen Liu, Jianan Mu, Shengwen Liang, Jing Ye 0001, Xiaowei Li, Huawei Li. HighTPI: A Hierarchical Graph Based Intelligent Method for Test Point Insertion. In 43rd IEEE VLSI Test Symposium, VTS 2025, Tempe, AZ, USA, April 28-30, 2025. pages 1-7, IEEE, 2025. [doi]
Abstract is missing.