Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching

Glenn H. Chapman, D. E. Bergen, K. Fang. Wafer-scale integration defect avoidance tradeoffs between laser links and Omega network switching. In 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1995, Lafayette, LA, USA, November 13-15, 1995. pages 37-45, IEEE Computer Society, 1995. [doi]

Abstract

Abstract is missing.