Jim Chapman, Jeff Currin, Steve Payne. A Low-Cost High-Performance CMOS Timing Vernier for ATE. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 459-468, IEEE Computer Society, 1995.
@inproceedings{ChapmanCP95,
title = {A Low-Cost High-Performance CMOS Timing Vernier for ATE},
author = {Jim Chapman and Jeff Currin and Steve Payne},
year = {1995},
researchr = {https://researchr.org/publication/ChapmanCP95},
cites = {0},
citedby = {0},
pages = {459-468},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}