A Low-Cost High-Performance CMOS Timing Vernier for ATE - researchr publication

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Jim Chapman, Jeff Currin, Steve Payne. A Low-Cost High-Performance CMOS Timing Vernier for ATE. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 459-468, IEEE Computer Society, 1995.

Abstract is missing.

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