Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois. Fault modeling of suspended thermal MEMS. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 319-328, IEEE Computer Society, 1999.
@inproceedings{CharlotMCLC99,
title = {Fault modeling of suspended thermal MEMS},
author = {Benoît Charlot and Salvador Mir and Érika F. Cota and Marcelo Lubaszewski and Bernard Courtois},
year = {1999},
tags = {modeling},
researchr = {https://researchr.org/publication/CharlotMCLC99},
cites = {0},
citedby = {0},
pages = {319-328},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}