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Fault modeling of suspended thermal MEMS

Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois. Fault modeling of suspended thermal MEMS. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 319-328, IEEE Computer Society, 1999.

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