Abhijit Chatterjee, Sabyasachi Deyati, Barry John Muldrey, Shyam Kumar Devarakond, Aritra Banerjee. Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 553-556, IEEE, 2012. [doi]
@inproceedings{ChatterjeeDMDB12,
title = {Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits},
author = {Abhijit Chatterjee and Sabyasachi Deyati and Barry John Muldrey and Shyam Kumar Devarakond and Aritra Banerjee},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6386726},
researchr = {https://researchr.org/publication/ChatterjeeDMDB12},
cites = {0},
citedby = {0},
pages = {553-556},
booktitle = {2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012},
publisher = {IEEE},
}