Abhijit Chatterjee, Sabyasachi Deyati, Barry John Muldrey, Shyam Kumar Devarakond, Aritra Banerjee. Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 553-556, IEEE, 2012. [doi]
Abstract is missing.