A methodology for yield-specific leakage estimation in memory - researchr publication authors

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Subho Chatterjee, Pramod Kolar, Wei Jian Chan, Jae Y. Ko, Gunjan H. Pandya. A methodology for yield-specific leakage estimation in memory. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

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