Subho Chatterjee, Pramod Kolar, Wei Jian Chan, Jae Y. Ko, Gunjan H. Pandya. A methodology for yield-specific leakage estimation in memory. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]
No references recorded for this publication.
No citations of this publication recorded.