Dibyendu Chatterjee, Uma Sharma, Hiroshi Murai, Tomohiko Kudo, Raghu Singanamalla, Haitao Liu. Body Bias Impact on ION Degradation in SiGe-Channel pMOS without Si-Cap for DRAM Periphery. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 22, IEEE, 2024. [doi]
Abstract is missing.