Genetic Algorithm based Approach for Low Power Combinational Circuit Testing - researchr publication authors

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Santanu Chattopadhyay, Naveen Choudhary. Genetic Algorithm based Approach for Low Power Combinational Circuit Testing. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 552, IEEE Computer Society, 2003. [doi]

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