Santanu Chattopadhyay, Naveen Choudhary. Genetic Algorithm based Approach for Low Power Combinational Circuit Testing. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 552, IEEE Computer Society, 2003. [doi]
@inproceedings{ChattopadhyayC03:0,
title = {Genetic Algorithm based Approach for Low Power Combinational Circuit Testing},
author = {Santanu Chattopadhyay and Naveen Choudhary},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/vlsid/2003/1868/00/18680552abs.htm},
tags = {rule-based, testing, systematic-approach},
researchr = {https://researchr.org/publication/ChattopadhyayC03%3A0},
cites = {0},
citedby = {0},
pages = {552},
booktitle = {16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-1868-0},
}