Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node

Eleni Chatzikyriakou, William Redman-White, C. H. De Groot. Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability, 68:21-29, 2017. [doi]

Authors

Eleni Chatzikyriakou

This author has not been identified. Look up 'Eleni Chatzikyriakou' in Google

William Redman-White

This author has not been identified. Look up 'William Redman-White' in Google

C. H. De Groot

This author has not been identified. Look up 'C. H. De Groot' in Google