Eleni Chatzikyriakou, William Redman-White, C. H. De Groot. Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability, 68:21-29, 2017. [doi]
@article{ChatzikyriakouR17,
title = {Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node},
author = {Eleni Chatzikyriakou and William Redman-White and C. H. De Groot},
year = {2017},
doi = {10.1016/j.microrel.2016.11.007},
url = {http://dx.doi.org/10.1016/j.microrel.2016.11.007},
researchr = {https://researchr.org/publication/ChatzikyriakouR17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {68},
pages = {21-29},
}