Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node

Eleni Chatzikyriakou, William Redman-White, C. H. De Groot. Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node. Microelectronics Reliability, 68:21-29, 2017. [doi]

Abstract

Abstract is missing.