Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs

Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty. Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs. IEEE Trans. VLSI Syst., 31(3):296-309, March 2023. [doi]

@article{ChaudhuriBKLC23,
  title = {Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs},
  author = {Arjun Chaudhuri and Sanmitra Banerjee and Jinwoo Kim and Sung Kyu Lim and Krishnendu Chakrabarty},
  year = {2023},
  month = {March},
  doi = {10.1109/TVLSI.2022.3228850},
  url = {https://doi.org/10.1109/TVLSI.2022.3228850},
  researchr = {https://researchr.org/publication/ChaudhuriBKLC23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {31},
  number = {3},
  pages = {296-309},
}