Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs

Arjun Chaudhuri, Sanmitra Banerjee, Jinwoo Kim, Sung Kyu Lim, Krishnendu Chakrabarty. Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs. IEEE Trans. VLSI Syst., 31(3):296-309, March 2023. [doi]

Abstract

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