Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle - researchr publication authors

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Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty. Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle. In Tulika Mitra, Evangeline Young, Jinjun Xiong, editors, Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022, San Diego, California, USA, 30 October 2022 - 3 November 2022. ACM, 2022. [doi]

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