Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty. Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle. In Tulika Mitra, Evangeline Young, Jinjun Xiong, editors, Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022, San Diego, California, USA, 30 October 2022 - 3 November 2022. ACM, 2022. [doi]
@inproceedings{ChaudhuriTC22-1,
title = {Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle},
author = {Arjun Chaudhuri and Jonti Talukdar and Krishnendu Chakrabarty},
year = {2022},
doi = {10.1145/3508352.3561121},
url = {https://doi.org/10.1145/3508352.3561121},
researchr = {https://researchr.org/publication/ChaudhuriTC22-1},
cites = {0},
citedby = {0},
booktitle = {Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022, San Diego, California, USA, 30 October 2022 - 3 November 2022},
editor = {Tulika Mitra and Evangeline Young and Jinjun Xiong},
publisher = {ACM},
isbn = {978-1-4503-9217-4},
}