2 Voltage Reference in 65-nm CMOS Exploiting Well-Proximity Effect

Chengyu Che, Ka-Meng Lei, Rui Paulo Martins, Pui-In Mak. 2 Voltage Reference in 65-nm CMOS Exploiting Well-Proximity Effect. IEEE Trans. Circuits Syst. II Express Briefs, 70(10):3822-3826, October 2023. [doi]

Abstract

Abstract is missing.