Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu. IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 403-407, IEEE Computer Society, 2002. [doi]
Abstract is missing.