Rafic Z. Makki - researchr alias

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Viewing Publication 1 - 23 from 23

2018

Nurturing the Growth of a National Infrastructure in Emerging TechnologiesRafic Z. Makki, Victor V. Zhirnov, Ralph K. Cavin III, Sami Issa, Marco Iansiti. pieee, 106(7):1126-1131, 2018. [doi]

2009

On Wires Holding a Handful of ElectronsValeriu Beiu, Walid Ibrahim, Rafic Z. Makki. nanonet 2009: 259-269 [doi]

2006

Scaling of i::DDT:: Test Methods for Random Logic CircuitsAli Chehab, Saurabh Patel, Rafic Z. Makki. et, 22(1):11-22, 2006. [doi]

2004

Measurement and Analysis of Physical Defects for Dynamic Supply Current TestingScott Thomas, Rafic Z. Makki, Sai Kishore Vavilala. delta 2004: 195-202 [doi]

2002

IDDT Test Methodologies for Very Deep Sub-micron CMOS CircuitsAli Chehab, Rafic Z. Makki, Michael Spica, David Wu. delta 2002: 403-407 [doi]

I::DDT:: Testing of Embedded CMOS SRAMsSuriya Ashok Kumar, Rafic Z. Makki, David W. Binkley. date 2002: 1117 [doi]

2000

Dynamic Power Supply Current Testing of CMOS SRAMsJian Liu, Rafic Z. Makki, Ayman I. Kayssi. et, 16(5):499-511, 2000. [doi]

1998

Dynamic Power Supply Current Testing of SRAMsJian Liu, Rafic Z. Makki, Ayman I. Kayssi. ats 1998: 348-353 [doi]

Testing of Embedded Memories - The AggregateRafic Z. Makki. ats 1998: 519 [doi]

1997

Advancements in Power Supply Current TestingRafic Z. Makki. vlsi, 5(3), 1997. [doi]

DDQ Testing Experiments for Various CMOS Logic Design StructuresAbdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole. vlsi, 5(3):253-271, 1997. [doi]

1995

Power supply current detectability of SRAM defectsJian Liu, Rafic Z. Makki. ats 1995: 367 [doi]

Transient Power Supply Current Testing of Digital CMOS CircuitsRafic Z. Makki, Shyang-Tai Su, Troy Nagle. itc 1995: 892-901

Transient power supply current monitoring - A new test method for CMOS VLSI circuitsShyang-Tai Su, Rafic Z. Makki, Troy Nagle. et, 6(1):23-43, 1995. [doi]

1994

Analysis and Characterization of State Assignment Techniques for Sequential MachinesRafic Z. Makki, Shyang-Tai Su. vlsi, 2(1):81-88, 1994. [doi]

Pioneer: A New Tool for Coding of Multi-Level Finite State Machines Based on Evolution ProgrammingSubbu Muddappa, Rafic Z. Makki, Zbigniew Michalewicz, Sridhar Isukapalli. vlsi, 2(2):105-116, 1994. [doi]

1992

Testing of static random access memories by monitoring dynamic power supply currentShyang-Tai Su, Rafic Z. Makki. et, 3(3):265-278, 1992. [doi]

A testable static RAM structure for efficient coverage of pattern sensitive faultsShyang-Tai Su, Rafic Z. Makki. vts 1992: 229-234 [doi]

1991

On the Integration of Design and Manufacturing for Improved TestabilityRafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene. itc 1991: 248-255

Automatic Test Pattern Generation with Branch TestingRafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang. TC, 40(6):785-791, 1991.

1990

Practical partitioning for testability with time-shared boundary scanRafic Z. Makki, Krisbnm Palaniswami. itc 1990: 970-977 [doi]

SSC-a tool for the synthesis of testable sequential machinesRafic Z. Makki, J. Muha, Silvio Bou-Ghazale, T. Kaylani. compcon 1990: 455-461 [doi]

1986

Designing Testable Control Paths with Multiple and Feedback Scan-PathsRafic Z. Makki, C. Tiansheng. itc 1986: 484-492

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