Venkata Chaitanya Krishna Chekuri, Arvind Singh, Nihar Dasari, Saibal Mukhopadhyay. On the Effect of NBTI Induced Aging of Power Stage on the Transient Performance of On-Chip Voltage Regulators. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
Abstract is missing.