Srivatsan Chellappa, Jia Ni, Xiaoyin Yao, Nathan Hindman, Jyothi Velamala, Min Chen, Yu Cao, Lawrence T. Clark. In-situ characterization and extraction of SRAM variability. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 711-716, ACM, 2010. [doi]
@inproceedings{ChellappaNYHVCCC10,
title = {In-situ characterization and extraction of SRAM variability},
author = {Srivatsan Chellappa and Jia Ni and Xiaoyin Yao and Nathan Hindman and Jyothi Velamala and Min Chen and Yu Cao and Lawrence T. Clark},
year = {2010},
doi = {10.1145/1837274.1837454},
url = {http://doi.acm.org/10.1145/1837274.1837454},
researchr = {https://researchr.org/publication/ChellappaNYHVCCC10},
cites = {0},
citedby = {0},
pages = {711-716},
booktitle = {Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010},
editor = {Sachin S. Sapatnekar},
publisher = {ACM},
isbn = {978-1-4503-0002-5},
}