In-situ characterization and extraction of SRAM variability

Srivatsan Chellappa, Jia Ni, Xiaoyin Yao, Nathan Hindman, Jyothi Velamala, Min Chen, Yu Cao, Lawrence T. Clark. In-situ characterization and extraction of SRAM variability. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 711-716, ACM, 2010. [doi]

Abstract

Abstract is missing.