Impact of On-Chip Inductance When Transitioning from Al to Cu Based Technology

Tom Chen. Impact of On-Chip Inductance When Transitioning from Al to Cu Based Technology. In 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 26-28 March 2001, San Jose, CA, USA. pages 173-178, IEEE Computer Society, 2001. [doi]

Abstract

Abstract is missing.