RaM-SAR: A Low Energy and Area Overhead, 11.3fJ/conv.-step 12b 25MS/s Secure Random-Mapping SAR ADC with Power and EM Side-channel Attack Resilience

Ruicong Chen, Hanrui Wang 0002, Anantha P. Chandrakasan, Hae-Seung Lee. RaM-SAR: A Low Energy and Area Overhead, 11.3fJ/conv.-step 12b 25MS/s Secure Random-Mapping SAR ADC with Power and EM Side-channel Attack Resilience. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 94-95, IEEE, 2022. [doi]

@inproceedings{Chen0CL22,
  title = {RaM-SAR: A Low Energy and Area Overhead, 11.3fJ/conv.-step 12b 25MS/s Secure Random-Mapping SAR ADC with Power and EM Side-channel Attack Resilience},
  author = {Ruicong Chen and Hanrui Wang 0002 and Anantha P. Chandrakasan and Hae-Seung Lee},
  year = {2022},
  doi = {10.1109/VLSITechnologyandCir46769.2022.9830365},
  url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830365},
  researchr = {https://researchr.org/publication/Chen0CL22},
  cites = {0},
  citedby = {0},
  pages = {94-95},
  booktitle = {IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9772-5},
}