Yung-Yuan Chen, Kun-Feng Chen. Incorporating Signature-Monitoring Technique in VLIW Processors. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 395-402, IEEE Computer Society, 2004. [doi]
Abstract is missing.