Built-in self-test and self-calibration for analog and mixed signal circuits

Tao Chen 0006, Degang Chen. Built-in self-test and self-calibration for analog and mixed signal circuits. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-8, IEEE, 2019. [doi]

Abstract

Abstract is missing.