Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks

Ching-Yuan Chen, Krishnendu Chakrabarty. Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 1074-1077, IEEE, 2021. [doi]

Authors

Ching-Yuan Chen

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Krishnendu Chakrabarty

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