Ching-Yuan Chen, Krishnendu Chakrabarty. Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021. pages 1074-1077, IEEE, 2021. [doi]
@inproceedings{ChenC21-39,
title = {Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks},
author = {Ching-Yuan Chen and Krishnendu Chakrabarty},
year = {2021},
doi = {10.23919/DATE51398.2021.9473989},
url = {https://doi.org/10.23919/DATE51398.2021.9473989},
researchr = {https://researchr.org/publication/ChenC21-39},
cites = {0},
citedby = {0},
pages = {1074-1077},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2021, Grenoble, France, February 1-5, 2021},
publisher = {IEEE},
isbn = {978-3-9819263-5-4},
}