Jyun-Wei Chen, Ying-Yen Chen, Jing-Jia Liou. Handling Pattern-Dependent Delay Faults in Diagnosis. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 151-157, IEEE Computer Society, 2007. [doi]
@inproceedings{ChenCL07:2,
title = {Handling Pattern-Dependent Delay Faults in Diagnosis},
author = {Jyun-Wei Chen and Ying-Yen Chen and Jing-Jia Liou},
year = {2007},
doi = {10.1109/VTS.2007.35},
url = {http://dx.doi.org/10.1109/VTS.2007.35},
researchr = {https://researchr.org/publication/ChenCL07%3A2},
cites = {0},
citedby = {0},
pages = {151-157},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}