Jyun-Wei Chen, Ying-Yen Chen, Jing-Jia Liou. Handling Pattern-Dependent Delay Faults in Diagnosis. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 151-157, IEEE Computer Society, 2007. [doi]
Abstract is missing.