Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs

W. C. Chen, S. H. Chen, Anabela Veloso, Kateryna Serbulova, Geert Hellings, Guido Groeseneken. Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]

Abstract

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