Kuo An Chen, Tsung-Wei Chang, Meng-Chen Wu, Mango Chia-Tso Chao, Jing-Yang Jou, Sonair Chen. Design-for-debug layout adjustment for FIB probing and circuit editing. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-9, IEEE, 2011. [doi]
Abstract is missing.