Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory

Qingyu Chen, Li Chen, Haibin Wang, Longsheng Wu, Yuanqing Li, Xing Zhao, Mo Chen. Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory. J. Electronic Testing, 32(6):695-703, 2016. [doi]

Abstract

Abstract is missing.