Analysis of the self-test characteristics of a micromachined accelerometer - researchr publication authors

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Weiping Chen, Xiaoliang Chen, Guoguang Zheng, Xiaowei Liu, Haifeng Zhang. Analysis of the self-test characteristics of a micromachined accelerometer. In 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE-NEMS 2009, Shenzhen, China, January 5-8, 2009. pages 396-399, IEEE, 2009. [doi]

This author has not been identified. Look up 'Weiping Chen' in GoogleThis author has not been identified. Look up 'Xiaoliang Chen' in GoogleThis author has not been identified. Look up 'Guoguang Zheng' in GoogleThis author has not been identified. Look up 'Xiaowei Liu' in GoogleThis author has not been identified. Look up 'Haifeng Zhang' in Google

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