A Methodology to Design Efficient BIST Test Pattern Generators - researchr publication

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Chih-Ang Chen, Sandeep K. Gupta. A Methodology to Design Efficient BIST Test Pattern Generators. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 814-823, IEEE Computer Society, 1995.

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