Test Generation for Crosstalk-Induced Faults: Framework and Computational Results

Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer. Test Generation for Crosstalk-Induced Faults: Framework and Computational Results. J. Electronic Testing, 18(1):17-28, 2002. [doi]

Authors

Wei-Yu Chen

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Sandeep K. Gupta

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Melvin A. Breuer

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