Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer. Test Generation for Crosstalk-Induced Faults: Framework and Computational Results. J. Electronic Testing, 18(1):17-28, 2002. [doi]
@article{ChenGB02:1,
title = {Test Generation for Crosstalk-Induced Faults: Framework and Computational Results},
author = {Wei-Yu Chen and Sandeep K. Gupta and Melvin A. Breuer},
year = {2002},
doi = {10.1023/A:1013771821826},
url = {http://dx.doi.org/10.1023/A:1013771821826},
tags = {testing},
researchr = {https://researchr.org/publication/ChenGB02%3A1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {18},
number = {1},
pages = {17-28},
}