Zhan Chen, Fook-Luen Heng. A Fast Minimum Layout Perturbation Algorithm for Electromigration Reliability Enhancement. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 56-63, IEEE Computer Society, 1998. [doi]
Abstract is missing.