Ran Chen, Shoubo Hu, Zhitang Chen, Shengyu Zhu 0001, Bei Yu 0001, Pengyun Li, Cheng Chen, Yu Huang, Jianye Hao. A Unified Framework for Layout Pattern Analysis With Deep Causal Estimation. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(4):1199-1211, April 2023. [doi]
Abstract is missing.