Test Compression for Neuromorphic Chips

Xin-Ping Chen, Hsu-Yu Huang, Chu-Yun Hsiao, Jennifer Shueh-Inn Hu, James Chien-Mo Li. Test Compression for Neuromorphic Chips. In IEEE European Test Symposium, ETS 2024, The Hague, Netherlands, May 20-24, 2024. pages 1-6, IEEE, 2024. [doi]

Abstract

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