Electrical characteristic and power consumption fluctuations of trapezoidal bulk FinFET devices and circuits induced by random line edge roughness - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Chieh-Yang Chen, Wen-Tsung Huang, Yiming Li. Electrical characteristic and power consumption fluctuations of trapezoidal bulk FinFET devices and circuits induced by random line edge roughness. In Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015. pages 61-64, IEEE, 2015. [doi]

This author has not been identified. Look up 'Chieh-Yang Chen' in GoogleThis author has not been identified. Look up 'Wen-Tsung Huang' in GoogleThis author has not been identified. Look up 'Yiming Li' in Google

runs on WebDSL